气相沉积技术在产品中的应用及发展

以某系列产品中端面齿盘采用离子镀加工为例,重点介绍了气相沉积技术中的真空离子镀技术在产品上的应用过程,并以此为基础,阐述了气相沉积技术在航空产品生产中的应用前景.     

Key Questions for Low Metallicity Stars Rapporteur Summary of the Working Group on Low-Z Stars

An overview of the discussions of the working group on Low-Z stars is presented. Key questions addressed include how the abundances of lithium observed in these stars should be compared to that produced in the Big Bang. Evidence for and against a small star-to-star variation in Li abundances is reviewed, and whether such a variation, if real, necessarily indicates that stellar depletion has occurred, necessitating correction to the value compared to primordial nucleosynthesis calculations. A second key question concerns how and where the light elements are produced. Taken together, their abundance ratios strongly suggest that in low-Z stars the light elements other than 7Li are produced by cosmic ray spallation. The most recent evidence suggests that a minority of this spallation happens in the general interstellar medium, and that a larger fraction might happen in the immediate vicinity of Supernovae, possibly producing observable star-to-star variation. Finally, the question of the overall metallicity of the Galaxy is discussed. How homogeneous in space and time is its evolution? Can we identify subsystems or individual stars which indicate a pregalactic contribution to the galactic metallicity?

     

Numerical Simulation of Characteristics of CEX Ions in Ion Thruster Optical System

Charge exchange(CEX) ions could inflict severe damages on the ion thruster optical system. This article is aimed at investigating the characteristics of the CEX ions and their influences upon the optical system by means of particle-in- cell(PIC) ion simulation and Monte Carlo collision(MCC) methods. The results from numerical simulation indicate that despite the fact that CEX ions appear in the entire beamlet region near the ion optical system, the ones that present themselves downstream of the accelerator grid have good reason for attracting more attention. As their trajectories are significantly affected by the local electric field, a great number of CEX ions are accelerated toward grids resulting in sputtering erosion. When the influences of the CEX ions are considered in the numerical simulation, there could hardly be observed augments in the screen grid current, but the accelerator grid current increases from zero to 1. 4% of the beamlet current. It can be understood from the numerical simulation that the CEX ions formed in the region far downstream of the accelerator grid should be blamed for the erosion on the downstream surface of the accelerator grid.     

Energisation of O+ and O+ 2 Ions at Mars: An Analysis of a 3-D Quasi-Neutral Hybrid Model Simulation

We have studied the loss of O⁺ and O⁺ ₂ ions at Mars with a numerical model. In our quasi-neutral hybrid model ions (H⁺, He⁺⁺, O⁺, O⁺ ₂) are treated as particles while electrons form a massless charge-neutralising fluid. The employed model version does not include the Martian magnetic field resulting from the crustal magnetic anomalies. In this study we focus the Martian nightside where the ASPERA instrument on the Phobos-2 spacecraft and recently the ASPERA-3 instruments on the Mars Express spacecraft have measured the proprieties of escaping atomic and molecular ions, in particular O⁺ and O⁺ ₂ ions. We study the ion velocity distribution and how the escaping planetary ions are distributed in the tail. We also create similar types of energy-spectrograms from the simulation as were obtained from ASPERA-3 ion measurements. We found that the properties of the simulated escaping planetary ions have many qualitative and quantitative similarities with the observations made by ASPERA instruments. The general agreement with the observations suggest that acceleration of the planetary ions by the convective electric field associated with the flowing plasma is the key acceleration mechanism for the escaping ions observed at Mars.     

On the Composition of the Solar Interior Rapporteur Paper I

Standard solar models, although they are free from the influence of much of the fluid motion that is bound to be present in the Sun, have been shown by helioseismology to represent the spherically averaged structure of the Sun amazingly well. This state of affairs has come about after painstaking refinements by a great many people of the pertinent microphysics, including that which controls the equation of state, the opacity, the nuclear reaction rates and the diffusion that inhibits gravitational segregation of chemical elements. It has instilled confidence in the modellers in being able to predict the composition of the solar interior. But there are consequences of the flow, related particularly to redistribution of chemical species, that can be difficult to identify observationally, yet which may degrade any inferences we might make. Their potential presence must at least be acknowledged by anyone who tries to asses the reliability of the models. This report summarizes the discussions in the preceding pages of this volume of the current theoretical and observational status of the subject, pointing to many of the caveats that have been raised, and attempting at the same time to put them into a seemingly coherent discourse in the context of our present understanding of the workings of the solar interior. This revised version was published online in June 2006 with corrections to the Cover Date.     

二氧化硅反应离子刻蚀中的微负载效应研究

对二氧化硅反应离子刻蚀中反应室压力,刻蚀气体流量和射频功率等因素对刻蚀速率和刻蚀均匀性的影响进行了研究。结果表明,通过对反应室压力、刻蚀气体流量和射频功率的调节,可以降低微负载效应的影响,得到良好的刻蚀均匀性。     

场致发射电推力器发射尖端理论模型及机理

为了研究铟场致发射电推力器的发射过程及机理,对椭球顶喷流柱模型离子发射区流柱的形状及尺寸进行了数学描述并通过数值计算加以验证,结果表明,椭球顶喷流柱模型具有合理性,从Taylor理论出发,结合电磁场理论、流体力学理论以及场致发射理论,讨论了离子形成的机理,发现场蒸发是离子产生的重要原因。     

离子注入铜薄膜后的氧化行为

为克服铜易氧化造成薄膜电阻增加、机械性能下降的缺点，采用离子注入技术对铜薄膜表面进行改性研究。离子注入后进行了氧化试验，并结合Ｘ射线衍射和卢瑟福背散射进行了分析。结果表明，离子注入对原有薄膜的电阻影响是很小的； 随注入剂量的增大，抗氧化能力提高；离子注入不但改善了铜薄膜的抗氧化能力，而且氧化行为及氧化层的结构也发生了变化，未经注入的铜薄膜形成的氧化铜以Ｃｕ２Ｏ为主，注入后氧化铜则为Ｃｕ２Ｏ 和ＣｕＯ 的复合结构。离子注入提高了铜薄膜抗氧化性能。     

SIMOX样品导电类型反型的研究

氧离子注入Ｐ型（１００）单晶硅形成ＳＩＭＯＸ样品，经俄歇电子能谱、扩展电阻仪测试，形成了ＳＯＩ结构；经霍尔测试仪测试，制备的ＳＩＭＯＸ样品表层硅膜反型为Ｎ型导电类型，ＳＩＭＯＸ样品的反型是硅中的氧施主所致，由近自由电子的类氦模型计算，氧施主电离能力为０．１５ｅＶ，该值与早期文献报道的实验值一致。